The GDA 150 is a robust CCD spectrometer developed for elemental depth profile analysis and bulk elemental analysis in the production sector. The GDA150 is tuned to meet the requirements of small and medium sized companies.

The instrument can be used e.g. for the following applications:

• to inspect the surfaces after diffusion processes
• to examine galvanic coating processes
• to analyze hard material coatings via PVD or CVD
• to assess hot-dip galvanizing as well as other kinds of galvanizing
• to analyze CIGS thin film solar cells
• to determine the elemental concentration in layers and bulk material

Thanks to the simple device operation and high speed of an analysis cycle it is possible to intervene quickly into the production process to correct any possible errors - a decisive advantage against conventional methods like metallographic investigations which need relatively long preparation time.

The GDA 550 is used for the analysis of conducting samples.

Based on the same frame as the GDA 750 and therefore utilizing the same stability and reliability, the GDA 550 analyzer uses photomultiplier technology for the analytical tasks.

The GDA 550 is designed to be equipped with a maximum of 63 photomultiplier tubes, which provides enough element channels for the most common analytical purposes.

The optional high resolution CCD optics extends the analytical capabilities of the GDA 550 into unmatched dimensions. Allowing you to add an almost unlimited amount of analytical element channels to any given method.

WinGDOES developed by SPECTRUMA is a user friendly program

for our GDA-Series analytical instruments.

The new software version 4.4 is the result of many years of development and provides a lot of interesting new features and improvements.

Win GDOES 4.4 can be installed without much effort. Your existing data can be easily imported and used.

Salient features of the new version
 

• Easy handling
• Customer friendly
• Operational safety 
• Windows 7 compatible
• Improved job management

Take advantage of our solid expertise and decades of experience on the subject of elemental analysis.

Our attainments vary according to your wishes. In consultation with you, we create a custom workflow for implementing the various processes in surface and thin layer analysis.

The combination of different methods for thin layer and surface analysis allows us to collect  as much as possible information of the objects to be studied.

We analyze in service of:

• Research and development
• Quality assurance
• Universities and Colleges
• Many major industries

Our services:

• Quantitative depth profile analysis of conductive layers
• Quantitative depth profile analysis of non-conductive layers
• Determine the chemical composition of its base material
  （Full Analysis, Bulk）
• Other procedures in the surface, interface and thin film analysis